Omega test contacting solution brings ultra high performance and lifespan, excellent contact resistance for analog/mixed signal and discrete device testing.
Omega test contacting solution is suitable for wafer level packaging devices having fine pitching. This pin is also compatible with most of the spring probe pins that availabe in the market.

Omega test contacting solution is configurable for:

  • Kelvin testing
  • Non-kelvin testing
  • Selective kelvin testing

Features & Benefits

  • Advance Contact Finishing (ACF) technology to overcome solder migration on contact tip & provides consistent contact resistance
  • Compatible with spring loaded probe footprint (no hardware change)
  • Hybrid pin tip profile provides better electrical contact & higher lifespan
  • Higher current handling capacity
  • Longer MTBA & MTBF
  • Higher OEE